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S. Hillier
Accurate quantitative analysis of clay and other minerals in sandstones by XRD; comparison of a Rietveld and a reference intensity ratio (RIR) method and the importance of sample preparation (in Mineral diagenesis and reservoir quality, the way forward)
Clay Minerals (March 2000), 35(1):291-302
Abstract: Index Terms/Descriptors: GeoRef, Copyright 2004, American Geological Institute.
X-ray diffraction is used widely for quantitative analysis of geological samples but studies which document the accuracy of the methods employed are not numerous. Synthetic sandstones of known composition are used to compare a "routine application" of a Rietveld and a reference intensity ratio (RIR) method of quantitative phase analysis. Both methods give similar results accurate to within approximately + or -3 wt.% at the 95% confidence level. The high degree of accuracy obtained is believed to depend to a large extent on the spray-drying method of sample preparation used to eliminate preferred orientation.
chemical analysis; chemical properties; clastic rocks; clay mineralogy; clay minerals; experimental studies; geochemistry; mineral composition; quantitative analysis; Rietveld refinement; sample preparation; sandstone; sedimentary rocks; sheet silicates; silicates; X-ray diffraction data